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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper CTuM25

Wafer Scale Profiling of Photonic Integrated Circuits

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Abstract

We demonstrate a thermal profiling technique for wafer-scale testing of optical distribution in photonic integrated circuits. The technique is used to quantify the absorption coefficient of a sub-threshold diode laser for varying operating conditions.

© 2003 Optical Society of America

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