Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy

J. C. Chen; C. Y. Lo; S. L. Huang; F. J. Kao

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
Technical Digest (Optica Publishing Group, 2003),
paper CWQ2

Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy

J. C. Chen, C. Y. Lo, S. L. Huang, and F. J. Kao

Conference on Lasers and Electro-Optics 2003

Baltimore, Maryland United States
1–6 June 2003
ISBN: 1-55752-733-4

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Microscopy and Wavefront Analysis (CWQ)

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J. C. Chen, C. Y. Lo, S. L. Huang, and F. J. Kao, "Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference, Technical Digest (Optica Publishing Group, 2003), paper CWQ2.

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Abstract

We have demonstrated the use of confocal fluorescent microscopy in mapping the Cr⁺³ profile within the YAG crystal fiber. A sensitivity of 1.0x10¹⁷/cm³ was achieved, which is more than an order of magnitude better than that of electron probe micro-analysis.

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