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  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper CThJ3

Phase-sensitive electric-field-induced second-harmonic microscopic probe of electronic materials

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Abstract

We demonstrate an electric-field-induced second-harmonic microscope that measures both amplitude and phase of imaged second-harmonic light with sub-micron spatial resolution , thus providing complete characterization of dc field variations near metal -semiconductor junctions.

© 2004 Optical Society of America

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