Metrology System for Space Interferometry Mission System Testbed 3

Alireza Azizi; Oscar Alvarez-Salazar; Renaud Goullioud; Yekta Gursel

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2004),
paper CTuO6

Metrology System for Space Interferometry Mission System Testbed 3

Alireza Azizi, Oscar Alvarez-Salazar, Renaud Goullioud, and Yekta Gursel

Conference on Lasers and Electro-Optics 2004

San Francisco, California United States
16–21 May 2004
ISBN: 1-55752-770-9

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Interferometry Applications I (CTuO)

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A. Azizi, O. Alvarez-Salazar, R. Goullioud, and Y. Gursel, "Metrology System for Space Interferometry Mission System Testbed 3," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2004), paper CTuO6.

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Abstract

A 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines; calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability better than 1 nm error.

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