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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper CTuP39

Microscopic Imaging of Defect Density Distribution in GaAs and InGaP using the Decay Time of Photo-Excited Carriers

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Abstract

Through pump-probe experiment using femtosecond laser pulses, we demonstrated that the defect density distribution in a GaAs and InGaP can be imaged by the decay time of photo-excited carriers.

© 2004 Optical Society of America

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