Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > CLEO > 2004 > CTuP > CTuP39
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper CTuP39

Microscopic Imaging of Defect Density Distribution in GaAs and InGaP using the Decay Time of Photo-Excited Carriers

K. Horiuchi, S. Kamata, M. Sato, F. Kannari, M. Hase, and M. Kitajima

Not Accessible

Your library or personal account may give you access

Abstract

Through pump-probe experiment using femtosecond laser pulses, we demonstrated that the defect density distribution in a GaAs and InGaP can be imaged by the decay time of photo-excited carriers.

© 2004 Optical Society of America

PDF Article
More Like This
Microscopic imaging of defect density distribution in InGaP and GaN using the decay time of photo-excited carriers

S. Kamata, K. Horiuchi, M. Sato, M. Kaneko, S. Takahashi, and F. Kannari
FWH10 Frontiers in Optics (FiO) 2004

Microscopic Imaging of Defect Density Distribution in GaAs Using the Decay Time of Photo-Excited Carriers

Kohei Horiuchi, Yasutaka Fujii, Muneaki Hase, and Masahiro Kitajima
MT17 Frontiers in Optics (FiO) 2003

Ultrafast Carrier Dynamics in Ferromagnetic Semiconductors

J. Wang, J. Kono, A. Owia, H. Munekata, and C. J. Stanton
ITuF4 International Quantum Electronics Conference (IQEC) 2004

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use