Nanomotion Measurement by Phase Conjugate Interferometry

R.M. Kurtz; R.D. Pradhan; T.M. Aye; G.D. Savant; M.V. Klein

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2004),
paper CTuX2

Nanomotion Measurement by Phase Conjugate Interferometry

R.M. Kurtz, R.D. Pradhan, T.M. Aye, G.D. Savant, and M.V. Klein

Conference on Lasers and Electro-Optics 2004

San Francisco, California United States
16–21 May 2004
ISBN: 1-55752-770-9

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Interferometry Applications II (CTuX)

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R. M. Kurtz, R. D. Pradhan, T. M. Aye, G. D. Savant, and M. V. Klein, "Nanomotion Measurement by Phase Conjugate Interferometry," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2004), paper CTuX2.

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Abstract

A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.

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