Rapid scanning all-reflective optical delay line

Xiumei Liu; Michael J. Cobb; Xingde Li

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2004),
paper CWJ4

Rapid scanning all-reflective optical delay line

Xiumei Liu, Michael J. Cobb, and Xingde Li

Conference on Lasers and Electro-Optics 2004

San Francisco, California United States
16–21 May 2004
ISBN: 1-55752-770-9

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OCT: Instrumentation and Signal Processing (CWJ)

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X. Liu, M. J. Cobb, and X. Li, "Rapid scanning all-reflective optical delay line," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2004), paper CWJ4.

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Abstract

We describe a dispersion-free high-speed scanning optical delay line, which is based on one curved and two flat reflective mirrors. A total scanning depth of 1.50 mm and a 4.1 kHz repetition rate is demonstrated.

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