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Conferences > CLEO > 2005 > CTuAA > CTuAA2
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2005),
  • paper CTuAA2

Determining Thickness Independently from Optical Constants Using Ultrafast Spectral Interferometry

Feng Huang, John F. Federici, Dale Gary, Thomas Jedju, and Warren S. Warren

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Abstract

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.

© 2005 Optical Society of America

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