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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2006),
  • paper CThBB6

Characterization of a 90° waveguide bend using near-field scanning optical microscopy

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Multiple modes are directly imaged in a silicon nitride waveguide bend using near-field scanning optical microscopy (NSOM). The observations are in good agreement with modal calculations using conformal index transformation.

© 2006 Optical Society of America

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