Design and Reliability of Mesa-Etched InP-based Geiger-Mode Avalanche Photodiodes

G.M. Smith; J.P. Donnelly; K.A. McIntosh; E.K. Duerr; C.J. Vineis; D.C. Shaver; S. Verghese; J.E. Funk; J.M. Mahan; P.I. Hopman; L.J. Mahoney; K.M. Molvar; F.J. O’Donnell; D.C. Oakley; K.G. Ray

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2006),
paper CThD7

Design and Reliability of Mesa-Etched InP-based Geiger-Mode Avalanche Photodiodes

G.M. Smith, J.P. Donnelly, K.A. McIntosh, E.K. Duerr, C.J. Vineis, D.C. Shaver, S. Verghese, J.E. Funk, J.M. Mahan, P.I. Hopman, L.J. Mahoney, K.M. Molvar, F.J. O’Donnell, D.C. Oakley, and K.G. Ray

Conference on Lasers and Electro-Optics 2006

Long Beach, California United States
21–26 May 2006
ISBN: 1-55752-813-6

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G. M. Smith, J. P. Donnelly, K. A. McIntosh, E. K. Duerr, C. J. Vineis, D. C. Shaver, S. Verghese, J. E. Funk, J. M. Mahan, P. I. Hopman, L. J. Mahoney, K. M. Molvar, F. J. O’Donnell, D. C. Oakley, and K. G. Ray, "Design and Reliability of Mesa-Etched InP-based Geiger-Mode Avalanche Photodiodes," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2006), paper CThD7.

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Abstract

Design modifications to InP-based Geiger-mode avalanche photodiodes are described that improve reliability. Geiger-mode aging at multiple conditions can cause significant degradation in some design variants while linear mode (below breakdown) aging does not.

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