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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
  • paper CTuV3

Quantitative Phase Microscopy by Multi-wavelength Phase-Shifting Interference Microscopy

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Abstract

The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2π discontinuities. Due to broadband light sources, images are less affected by coherent noise.

© 2007 Optical Society of America

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