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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest Series (CD) (Optica Publishing Group, 2007),
  • paper JThD7

A Total Internal Reflection Technique for Time Resolved Measurements of Index of Refraction

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Abstract

We present a method using total-internal reflection for measuring small index-of- refraction changes (Δn=1×10−5). The technique overcomes requirements of diffraction-limited laser performance, is auto-calibrating, and paves the way for sensitive single-shot ultrafast measurements of material dynamics.

© 2007 Optical Society of America

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