Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper JThA14

EBIC and HR-TEM Study of Catastrophic Optical Damaged High Power Multi-Mode InGaAs-AlGaAs Strained Quantum Well Lasers

Not Accessible

Your library or personal account may give you access

Abstract

We report our investigation of catastrophic optical damaged high power multi-mode InGaAs-AlGaAs strained quantum well (QW) lasers using electron beam induced current (EBIC), focused ion beam (FIB), and high-resolution transmission electron microscope (HR-TEM) techniques.

© 2008 Optical Society of America

PDF Article
More Like This
Investigation of Catastrophic Optical Mirror Damage in High Power Single-Mode InGaAs-AlGaAs Strained Quantum Well Lasers with Focused Ion Beam and HR-TEM Techniques

Yongkun Sin, Nathan Presser, Brendan Foran, Maribeth Mason, and Steven C. Moss
CThEE5 Conference on Lasers and Electro-Optics (CLEO:S&I) 2007

Failure Mode Investigation of High Power Multi-Mode InGaAs-AlGaAs Strained Quantum Well Lasers using Time-Resolved EL and EBIC Techniques

Yongkun Sin, Neil Ives, Nathan Presser, and Steven C. Moss
JTuD16 Conference on Lasers and Electro-Optics (CLEO:S&I) 2009

Two Distinct Types of Dark-Line Defects in a Failed InGaAs/AlGaAs Strained Quantum Well Laser Diode

Brendan Foran, Nathan Presser, Yongkun Sin, Maribeth Mason, and Steve C. Moss
CWF5 Conference on Lasers and Electro-Optics (CLEO:S&I) 2009

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved