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Conferences > CLEO > 2009 > CWF > CWF5
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper CWF5
  • •https://doi.org/10.1364/CLEO.2009.CWF5

Two Distinct Types of Dark-Line Defects in a Failed InGaAs/AlGaAs Strained Quantum Well Laser Diode

Brendan Foran, Nathan Presser, Yongkun Sin, Maribeth Mason, and Steve C. Moss

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Abstract

TEM characterization of accelerated life-test failed InGaAs/AlGaAs quantum well 980nm laser diodes, prepared by FIB sampling following EBIC, found two distinct types of dark-line defects providing insight for physics of failure models.

© 2009 Optical Society of America

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