High-Order Thermal Ghost Imaging

Kam Wai Clifford Chan; Malcolm N. O’Sullivan; Robert W. Boyd

doi:10.1364/CLEO.2009.JTuD100

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
OSA Technical Digest (CD) (Optica Publishing Group, 2009),
paper JTuD100
•https://doi.org/10.1364/CLEO.2009.JTuD100

High-Order Thermal Ghost Imaging

Kam Wai Clifford Chan, Malcolm N. O’Sullivan, and Robert W. Boyd

Conference on Lasers and Electro-Optics 2009

Baltimore, Maryland United States
31 May–5 June 2009
ISBN: 978-1-55752-869-8

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Joint CLEO Poster Session I (JTuD)

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K. W. C. Chan, M. N. O’Sullivan, and R. W. Boyd, "High-Order Thermal Ghost Imaging," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference, OSA Technical Digest (CD) (Optica Publishing Group, 2009), paper JTuD100.

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Abstract

We show that high-order ghost imaging has higher visibility and contrast-to-noise ratio as compared to conventional thermal ghost imaging. We also obtain the optimal polynomial order that gives the best contrast-to-noise ratio.

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