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Conferences > CLEO > 2010 > CThAA > CThAA1

Characterization of SOI Microrings Using IR Imaging

Michael L. Cooper, Greeshma Gupta, Jung S. Park, Mark A. Schneider, Ivan B. Divliansky, and Shayan Mookherjea

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Abstract

We demonstrate a non-invasive diagnostic method of quantitative infrared (IR) imaging, applied here to a series cascade of microring resonators fabricated in silicon-on-insulator. The IR images contain information on the otherwise inaccessible individual through-ports and the resonators themselves, providing coupling, loss and intensity-enhancement parameters for the individual rings.

© 2010 Optical Society of America

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