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Cryogenic Optical Characterization of Nonlinear Polymers

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Abstract

We report a second-order electro-optic coefficient r33 of 155±5 pm/V at a telecommunication wavelength of 1550 nm from nonlinear poled polymer thin films at a cryogenic temperature of ~4.2 Kelvin using a reflection ellipsometry technique.

© 2010 Optical Society of America

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