Ultrafast, Chipscale, Optically-Gated Optical Sampler

Ta-Ming Shih; Ta-Ming Shih; Chris H. Sarantos; Chris H. Sarantos; Susan M. Haynes; John E. Heebner

doi:10.1364/CLEO.2010.CWH1

Conference on Lasers and Electro-Optics 2010
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper CWH1
•https://doi.org/10.1364/CLEO.2010.CWH1

Ultrafast, Chipscale, Optically-Gated Optical Sampler

Ta-Ming Shih, Chris H. Sarantos, Susan M. Haynes, and John E. Heebner

Conference on Lasers and Electro-Optics 2010

San Jose, California United States
16–21 May 2010
ISBN: 978-1-55752-889-6

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Ultrafast and Broadband Applications of Nonlinear Optics (CWH)

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T. Shih, C. H. Sarantos, S. M. Haynes, and J. E. Heebner, "Ultrafast, Chipscale, Optically-Gated Optical Sampler," in Conference on Lasers and Electro-Optics 2010, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper CWH1.

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Abstract

We demonstrate a novel single-shot optical recorder capable of picosecond-scale resolution across hundreds of ps of record length. The concept is a hybrid between cross-correlators and Mach-Zehnder-gated samplers, with advantages over both techniques.

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