Abstract
We present a method to measure the index of refraction of a wafer-type material accurately by using a modified Michelson interferometer. With this method, the difference between the refractive index of the ordinary-wave and that of the extraordinary-wave in the representative nonlinear crystal, LiNbO3 could be measured with ease.
© 2007 IEEE
PDF ArticleMore Like This
Hee Joo Choi, Byeong Joo Kim, Hwan Hong Lim, and Myoungsik Cha
JWC8 Frontiers in Optics (FiO) 2007
Foo Cexiang, Gaurav Madan, Theresa Lai, Mark Wee, Y. Fu, and H.M. Shang
LOPETII320 Education and Training in Optics and Photonics (ETOP) 2001
Tetsuo Harimoto and Kikyo Toshima
P_OTh_26 International Conference on Optics-Photonics Design and Fabrication (ODF) 2022