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Conferences > CLEOPR > 2007 > WE3 > WE3_6
  • Conference on Lasers and Electro-Optics/Pacific Rim 2007
  • (Optica Publishing Group, 2007),
  • paper WE3_6

Polarization Measurement Using Two-Photon Absorption of a Si Avalanche Photodiode

Toshiaki Kagawa

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Abstract

Polarization of 1.55-µm-wavelength light was measured by using two-photon absorption (TPA) of a Si avalanche photodiode (APD). The APD was illuminated with the light under test and with linearly polarized light. The photocurrent produced by the cross-TPA was used to determine the polarization of the light under test.

© 2007 IEEE

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