Stigmatic Imaging Mass Spectrometry Using a Multi-Turn Time-of-Flight Mass Spectrometer

Hisanao Hazama; Hisanao Hazama; Jun Aoki; Jun Aoki; Hirofumi Nagao; Hirofumi Nagao; Hidetoshi Yoshimura; Hidetoshi Yoshimura; Yasuhide Naito; Yasuhide Naito; Michisato Toyoda; Michisato Toyoda; Katsuyoshi Masuda; Katsuyoshi Masuda; Kenichi Fujii; Kenichi Fujii; Toshio Tashima; Kunio Awazu; Kunio Awazu; Kunio Awazu

Conference on Lasers and Electro-Optics/Pacific Rim 2009
(Optica Publishing Group, 2009),
paper ThF4_2

Stigmatic Imaging Mass Spectrometry Using a Multi-Turn Time-of-Flight Mass Spectrometer

Hisanao Hazama, Jun Aoki, Hirofumi Nagao, Hidetoshi Yoshimura, Yasuhide Naito, Michisato Toyoda, Katsuyoshi Masuda, Kenichi Fujii, Toshio Tashima, and Kunio Awazu

Conference on Lasers and Electro-Optics/Pacific Rim 2009

Shanghai China
30 August–3 September 2009
ISBN: 978-1-4244-3830-3

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Laser Chemistry II (ThF4)

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H. Hazama, J. Aoki, H. Nagao, H. Yoshimura, Y. Naito, M. Toyoda, K. Masuda, K. Fujii, T. Tashima, and K. Awazu, "Stigmatic Imaging Mass Spectrometry Using a Multi-Turn Time-of-Flight Mass Spectrometer," in Conference on Lasers and Electro-Optics/Pacific Rim 2009, (Optica Publishing Group, 2009), paper ThF4_2.

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Abstract

A stigmatic imaging mass spectrometer using a multi-turn time-of-flight mass spectrometer, MULTUM-IMG, has been developed. The ion images were maintained after 10 cycles in MULTUM-IMG and a mass resolving power of 14000 was achieved.

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