Abstract

We analyzed the influence of a current aging on 380 nm band near-ultraviolet light-emitting diodes with different current densities. Aging have been carried out on LEDs with current densities of 5, 35 and 50 A/cm² at room temperature for 1000 h. After stressed, both optical and electrical characteristics of LEDS are getting worse as increasing aging current density. We suggest that the possible degradation mechanism of characteristics is increase of the non-radiative (NR) recombination of LEDs due to generation of NR recombination centers in active regions after a current aging.

© 2015 IEEE