Infrared metrology with visible photons

Leonid A. Krivitsky; Anna V. Paterova; Anna V. Paterova; Hongzhi Yang; Chengwu An; Dmitry A. Kalashnikov

doi:10.1364/CLEOPR.2018.Tu3F.7

CLEO Pacific Rim Conference 2018
OSA Technical Digest (Optica Publishing Group, 2018),
paper Tu3F.7
•https://doi.org/10.1364/CLEOPR.2018.Tu3F.7

Infrared metrology with visible photons

Leonid A. Krivitsky, Anna V. Paterova, Hongzhi Yang, Chengwu An, and Dmitry A. Kalashnikov

Conference on Lasers and Electro-Optics/Pacific Rim 2018

Hong Kong China
29 July–3 August 2018
ISBN: 978-1-943580-45-3

From the session
Novel Measurement Methods II (Tu3F)

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L. A. Krivitsky, A. V. Paterova, H. Yang, C. An, and D. A. Kalashnikov, "Infrared metrology with visible photons," in CLEO Pacific Rim Conference 2018, OSA Technical Digest (Optica Publishing Group, 2018), paper Tu3F.7.

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Abstract

We realize an infrared (IR) metrology technique, which uses only components for the visible range. It relies on nonlinear interference of correlated photons. We show its applications to IR spectroscopy, optical coherence tomography and imaging.

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