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Conferences > CLEOPR > 2018 > W4F > W4F.7

Spatially scanning dual-comb spectroscopy for precise measurement of refractive index and thickness profiles of solids

Yue Wang, Akifumi Asahara, Ken-ichi Kondo, and Kaoru Minoshima

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Abstract

Raster-scanning dual-comb spectroscopy is used to simultaneously evaluate the refractive index and thickness profiles of solid samples. Refractive index and step structure profiles of glass plates are evaluated successfully with 10−4 uncertainty.

© 2018 The Author(s)

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