Abstract

Fourier ptychography microscopy(FPM) is a recently developed computational imaging approach for microscopic super-resolution imaging. Nevertheless, FPM has high requirements for the system construction and data acquisition processes which brings many limitations to its practical applications. In this paper, we propose a Fourier ptychography multi-parameter neural network (FPMN) with composite physical prior optimization. A hybrid parameter determination strategy combining physical imaging model and data-driven network training is proposed to recover the multi layers of the network corresponding to different physical parameters, including sample complex function, system pupil function, defocus distance, LED array position deviation and illumination intensity fluctuation, etc. Among these parameters, LED array position deviation is recovered based on the features of brightfield to darkfield transition low-resolution images while the others are recovered in the process of training of the neural network. The feasibility and effectiveness of FPMN are verified through simulations and actual experiments. Therefore, FPMN can evidently reduce the requirement for practical applications of FPM.

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