Stress distribution measurement in oscillating quartz crystals with a laser probe

Ichiji Yasuda; Sekiji Yamagata

doi:10.1364/CLEOS.1976.WC10

Conference on Laser and Electrooptical Systems
Technical Digest Series (Optica Publishing Group, 1976),
paper WC10
•https://doi.org/10.1364/CLEOS.1976.WC10

Stress distribution measurement in oscillating quartz crystals with a laser probe

Ichiji Yasuda and Sekiji Yamagata

Conference on Laser and Electrooptical Systems 1976

San Diego, Calif. United States
25–27 May 1976
ISBN:

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Analytical and Diagnostic Instruments: 1 (WC)

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I. Yasuda and S. Yamagata, "Stress distribution measurement in oscillating quartz crystals with a laser probe," in Conference on Laser and Electrooptical Systems, Technical Digest Series (Optica Publishing Group, 1976), paper WC10.

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Abstract

A quantitative dynamic stress measuring method in oscillating quartz crystals by means of optical beam modulation is reported. The principle of the measurement is as follows: The oscillating quartz crystal is placed between crossed polarizers. The modulated light intensity is expressed by ΔI/I = Δδ-sinδ/2 sin²(δ/2), where I is the de component and ΔI is the accomponent of the modulated light intensity, respectively.

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