Terahertz reflectometry of multi-layered paint thicknesses and estimation of particle sizes

Anis Rahman; Aunik K Rahman

doi:10.1364/CLEO_AT.2014.AW3H.4

CLEO: 2014
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper AW3H.4
•https://doi.org/10.1364/CLEO_AT.2014.AW3H.4

Terahertz reflectometry of multi-layered paint thicknesses and estimation of particle sizes

Anis Rahman and Aunik K Rahman

CLEO: Applications and Technology 2014

San Jose, California United States
8–13 June 2014
ISBN: 978-1-55752-999-2

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High Performance Optical Measurement (AW3H)

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A. Rahman and A. K. Rahman, "Terahertz reflectometry of multi-layered paint thicknesses and estimation of particle sizes," in CLEO: 2014, OSA Technical Digest (online) (Optica Publishing Group, 2014), paper AW3H.4.

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Abstract

A terahertz reflectometer was designed and utilized for measuring paint panels comprised of layers of paint, primer and overcoat. Particle size of the paint additives were estimated by contour plot derived from 3D surface map.

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