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Structural characterization and luminescence properties of ErxSc2-xSi2O7 prepared by RF sputtering

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Abstract

Polycrystalline ErxSc2-xSi2O7 compounds were fabricated using RF-sputtering by alternating Er2O3, Sc2O3 layers separated by SiO2 layer. This new compounds presents excitation cross section at 980nm around 1.39×10−21cm2 with lifetime of 38 μs.

© 2014 Optical Society of America

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