Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Multiplexed Two-color Phase-and-amplitude Characterization of Harmonic Up-conversion in OAM Beams using Ptychography

Not Accessible

Your library or personal account may give you access

Abstract

We present high-resolution, simultaneous two-color phase-and-amplitude characterization of 2nd harmonic up-conversion in OAM beams by ptychography. We measure topological charge conservation during 2nd harmonic generation process, which can be extended to high-order harmonic upconversion.

© 2018 The Author(s)

PDF Article
More Like This
Characterization of Highly Structured High Harmonic Beams through Multiplexed Broadband Ptychography

David Schmidt, David Goldberger, Alba De Las Heras, Carlos Hernández-García, Yuhao Lei, Peter Kazansky, Daniel Adams, and Charles Durfee
FM5D.3 Frontiers in Optics (FiO) 2021

Multiplexed broadband ptychography characterization of complex spatial and spectral EUV beams from high harmonic generation

David Schmidt, David Goldberger, Alba De Las Heras, Carlos Hernández-García, Yuhao Lei, Peter Kazansky, Daniel Adams, and Charles Durfee
SW4F.2 CLEO: Science and Innovations (CLEO_SI) 2022

Using multiplexed broadband ptychography in characterizing EUV light from high harmonic generation

David Schmidt, David Goldberger, Alba De Las Heras, Carlos Hernández-García, Yuhao Lei, Peter Kazansky, Daniel Adams, and Charles Durfee
CF1D.3 Computational Optical Sensing and Imaging (COSI) 2022

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2023 | Optica Publishing Group. All Rights Reserved