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Plasmonic-assisted Mach-Zehnder Interferometric photonic sensor using aluminum waveguides

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Abstract

We demonstrate a CMOS compatible interferometric plasmo-photonic sensor exploiting SisN4 photonic and aluminum (Al) plasmonic stripe waveguides. Experimental evaluation revealed bulk sensitivity of 4764 nm/RIU, holding promise for ultra-sensitive and low cost sensing devices.

© 2020 The Author(s)

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Poster Presentation

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