A New Method to Measure Thermal Impedance for All-Active Semiconductor Lasers using the Athermalisation Condition

Dovydas Mickus; Caolan Murphy; Robert McKenna; John Donegan

doi:10.1364/CLEO_AT.2022.JTh3A.35

Conference on Lasers and Electro-Optics
Technical Digest Series (Optica Publishing Group, 2022),
paper JTh3A.35
•https://doi.org/10.1364/CLEO_AT.2022.JTh3A.35

A New Method to Measure Thermal Impedance for All-Active Semiconductor Lasers using the Athermalisation Condition

Dovydas Mickus, Caolan Murphy, Robert McKenna, and John Donegan

CLEO: Applications and Technology 2022

San Jose, California United States
15–20 May 2022
ISBN: 978-1-957171-05-0

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Joint Poster Session III-A (In-person) (JTh3A)

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D. Mickus, C. Murphy, R. McKenna, and J. Donegan, "A New Method to Measure Thermal Impedance for All-Active Semiconductor Lasers using the Athermalisation Condition," in Conference on Lasers and Electro-Optics, Technical Digest Series (Optica Publishing Group, 2022), paper JTh3A.35.

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Abstract

A method for measuring thermal impedance of several laser sections at once is presented. We measured thermal impedance length product as 29.3±2.1 and 39.33±2.8^oC µm/mW for gain and grating sections respectively for our DBR lasers.

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