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Conferences > CLEO_AT > 2022 > JW3A > JW3A.32

Infrared Refractive Index Measurement of Niobium Nitride Thin-Film via FTIR

Dip Joti Paul, Tony X. Zhou, and Karl K. Berggren

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Abstract

We report the optical constants of thin-film NbN in the wavelength of 2.5 to 25 µm, which is determined by fitting Drude-Lorentz dielectric function to the reflectance and transmittance data obtained via FTIR.

© 2022 The Author(s)

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