Multiscale Numerical Modeling for Near-Field Microwave Impedance Microscopy

Diego Tami; Diego Tami; Douglas A. A. Ohlberg; Jhonattan C. Ramirez; Jhonattan C. Ramirez; Cássio Gonçalves do Rego; Cássio Gonçalves do Rego; Gilberto Medeiros-Ribeiro; Gilberto Medeiros-Ribeiro

doi:10.1364/CLEO_AT.2022.JW3A.6

Conference on Lasers and Electro-Optics
Technical Digest Series (Optica Publishing Group, 2022),
paper JW3A.6
•https://doi.org/10.1364/CLEO_AT.2022.JW3A.6

Multiscale Numerical Modeling for Near-Field Microwave Impedance Microscopy

Diego Tami, Douglas A. A. Ohlberg, Jhonattan C. Ramirez, Cássio Gonçalves do Rego, and Gilberto Medeiros-Ribeiro

CLEO: Applications and Technology 2022

San Jose, California United States
15–20 May 2022
ISBN: 978-1-957171-05-0

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D. Tami, D. A. A. Ohlberg, J. C. Ramirez, C. G. do Rego, and G. Medeiros-Ribeiro, "Multiscale Numerical Modeling for Near-Field Microwave Impedance Microscopy," in Conference on Lasers and Electro-Optics, Technical Digest Series (Optica Publishing Group, 2022), paper JW3A.6.

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Abstract

In this work, we analyzed numerically a multiscale nanosystem based on sMIM on TBG. Spontaneous formation of a water-meniscus by the approximation between the tip-sample concentrates the microwave fields, reaching resolutions of up to 1nm.

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