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Conferences > CLEO_Apps > 2010 > JWB > JWB5

Molecular water accumulation on silica measured with picometer height resolution

Xuefeng Wang, Ming Zhao, and David D. Nolte

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Abstract

We observed water film accumulation on silica surfaces to 1 picometer resolution using optical land-contrast (LC) interferometry. The land-contrast approach is non-destructive and allows real-time measurement of thickness variation of small molecular films.

© 2010 Optical Society of America

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