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Conferences > CLEO_Europe > 1994 > CTuJ > CTuJ3

Characterization of micro- and optoelectronic devices by ultrafast optical techniques

Hartmut G. Roskos

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Abstract

Ultrafast optical techniques continue to gain acceptance for the characterization of high-speed micro- and optoelectronic devices and circuits. In this talk, the most important optical measurement techniques are described and their status critically reviewed.

© 1994 IEEE

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