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  • Conference on Lasers and Electro-Optics Europe
  • Technical Digest Series (Optica Publishing Group, 2000),
  • paper CWF110

Wavefront measurement using electro-optic scanning with a liquid-crystal SLM

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Abstract

The developed wavefront sensor [1] is based on the original Hartmann principle in which the aperture can be moved across the wavefront to analyze by an electro-optic programmable device. According to the operation principle shown in figure 1(a), the position of the diffraction pattern is measured on a CCD detector array at a distance d behind a lens of focal length f. If (x′,y′) is the measured position of the beam transmitted by the aperture moving on the SLM, the local wavefront slope at position (x,y) is derived from the following expression: and a similar equation holds for the y-derivative. These data are stored in a memory for each position of the sampling aperture displayed on the spatial light modulator (SLM) and which sequentially scans the wavefront.

© 2000 IEEE

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