Abstract

Thermally induced second-order susceptibility located beneath the anodic surface over a 10 pm thick layer has been measured in thermally poled fused silica glasses [1]. For many practical applications, one need to largely control the profile and the location of x⁽²⁾. Here we propose a non destructive method that allow to infer the profile and location of the nonlinear area and makes it possible to deduce the charge distribution induced within the poled glass sample.

© 2000 IEEE