Abstract
Knowledge of the exact characteristics (amplitude and phase) of the ultrashort pulses interacting with the specimen in a two photon excited fluorescence (TPEF) microscope is important for optimal imaging. For example, the efficiency and selectivity of the two photon excitation process can be improved by modifying the phase of the pulses So there is a great demand on techniques that are able to characterize the pulses directly at the sample plane of the microscope. Techniques like Collinear Frequency Resolved Optical Gating (CFROG) arrangement can be implemented in a microscope for complete pulse characterisation at the sample plane. However, this requires additional forward collecting optics as well as a suitable frequency doubling crystal.
© 2007 IEEE
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