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An optically trapped particle works as an extremely sensitive probe for the measurement of pico- and fcmto-Ncwton forces in microscopic systems (Photonic Force Microscopy, PFM). A typical set-up (Fig. 1) comprises an optical trap to hold the probe particle and a position sensing system [1], The latter uses either the forward-scattered (FS) or back-scattered (BS) field projected on a Quadrant Photon Detector (QPD) or a Position Sensitive Detector (PSD) to monitor the position of the particle.
© 2007 IEEE
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