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Optica Publishing Group
  • CLEO/Europe and EQEC 2009 Conference Digest
  • (Optica Publishing Group, 2009),
  • paper CL2_4

Statistical tracking of nanoparticles using selective plane illumination microscope

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Abstract

Last decade the emerging progress in monodisperse colloids synthesis has attracted the attention to wide range of their applications. Noble metal nanoparticles, due to their tunable plasmonic resonant properties are successfully used in biomedical studies as optical detectable nanolabels. Different dark field illumination optical arrangements including transmitted or reflected light condensers, total internal reflection illumination or side illumination could be used to detect and localize nanoparticles [1]. The latter approach provides the better contrast for free floating particles away from the cover slip surface. It is based on the 100-years old idea of selective plane illumination microscopy (SPIM), originally proposed for colloidal particles observation and once termed “ultramicroscopy” [2]. Illumination with bright light beam propagating orthogonally to the observation direction provides high contrast images of nanometer sized particles on the dark background. If particles are substantially smaller than light wavelength, they appear like point source images defined only by point spread function of microscope. Light beam is shaped to uniformly illuminate selective plane in the microscope field of view avoiding light scattering by the out of focus particles [3]. Selective plane illumination is used not only for Raleigh particles observation. It was very successful adopted to fluorescent microscopy and the optical slicing of biological objects [4, 5].

© 2009 IEEE

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