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Optica Publishing Group
  • CLEO/Europe and EQEC 2011 Conference Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2011),
  • paper CF_P20

Sub-12 fs pulses characterization by self-referenced spectral interferometry

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Abstract

Self-referenced spectral interferometry (SRSI) is a recently demonstrated single-shot characterization technique [1]. This technique relies on the spectral interference between the pulse to characterize and a reference pulse generated from the pulse itself by cross-polarized wave generation (XPW)[2]. Under the right experimental conditions, the XPW pulse is shorter than the input pulse and exhibits a broader and smoother spectrum with a flat, or at least computable, spectral phase. Such properties are highly favorable for high-dynamic range spectral interferometry and high-contrast SRSI measurements have recently been demonstrated [3]. In this paper, we show the ability to optimize pulses down to 11.7 fs at their Fourier limit using feedback loops between a pulse shaper and the SRSI device.

© 2011 Optical Society of America

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