Abstract
Recently introduced for near IR femtosecond pulses [1], Self-Referenced Spectral Interferometry (SRSI) is a single shot ultrashort pulse measurement method based on spectral interferometry in which the reference pulse is obtained through a non linear temporal filter, here a Cross-Polarized wave generation (XPW)[2]. As the XPW generation is achromatic, the SRSI technique is directly transposable to UV pulses. In this talk, we demonstrate the SRSI measurement of pulses at 266nm and 400nm on the same optical set-up.
© 2011 Optical Society of America
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