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  • CLEO/Europe and EQEC 2011 Conference Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2011),
  • paper CM_P12

Rapid calculation of the energy deposition profiles for processing of dielectrics with femtosecond lasers

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The energy deposition profile of a focused beam inside a dielectric material is conditioned by linear and nonlinear propagation effects. This can substantially distort the desired shape of the transformed region in laser processing applications [1]. By solving the nonlinear Schrödinger equation (NLSE) using the split-step propagation technique or similar calculation procedures it is possible to perform accurate estimations of the energy deposition profile [2,3]. However, this is usually not practical in terms of a balance between computation time and accuracy. Thus, an experimental study considering various parameters (pulse energy, duration, processing depth, beam ellipticity, etc.) is the typical approach to determine a set of optimized “laser writing” parameters that yield the best result.

© 2011 Optical Society of America

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