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  • 2013 Conference on Lasers and Electro-Optics - International Quantum Electronics Conference
  • (Optica Publishing Group, 2013),
  • paper CE_P_17

Mapping Purity of Single-walled Carbon Nanotubes in Bulk Samples with Multiplex Coherent Anti-Stokes Raman Microscopy

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Abstract

Single-walled carbon nanotubes (SWNT) play a very important role in nanotechnology such as in the development of biosensors and molecule stabilization [1]. SWNT are also very attractive for industrial applications due to catalytic features and functionalization potential. Their unique electrical and structural properties allow studies in different areas. However, all existent methods of carbon nanotubes synthesis produce an undesired amount of impurity like amorphous carbon and traces of metallic catalysts, which strongly affect the SWNT properties. Thus, a technique for the characterization of local impurity in bulk samples of SWNT is desired.

© 2013 IEEE

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