Abstract

The development of pulsed light sources is crucially connected to proper characterization methods especially for the spectral and temporal emission behavior. In the nanosecond regime, the characterization in either domain is a straight forward task employing standard metrology like optical spectrum analyzers (OSA) and oscilloscopes. However, in contrast to the ultrashort-pulse scale, where simultaneous characterization in the time and frequency domain is already demonstrated [1], there is no proper technique to achieve the same for nanosecond pulses.

© 2013 IEEE