Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference
  • (Optica Publishing Group, 2015),
  • paper CB_P_33

Original Screening Methodology based on Correlation between Low-Frequency Noise Measurements and Reverse Bias Behavior of GaAs-based Laser Diodes

Not Accessible

Your library or personal account may give you access

Abstract

We report on a relevant and sensitive methodology based on reverse I-V measurements correlated with low frequency electrical current noise measurements on chip-on-submount (CoS) GaAs-based Laser diodes. The objective is the screening tests improvement and electro-optical parameters cross-correlation assessment. As reported in a previous paper [1], equivalent DC electrical model of InGaAs/AlGaAs 9xx nm Laser diode is represented as an ideal diode representative of the active region (D1) and the lateral one (D2) clamped by a Zener diode in addition with an overall linear resistance RSH. It is well-known from literature that forward I-V measurements are impacted by serious defects in the active zone. Reverse characterizations especially close to breakdown voltage can reveal atypical behaviors in order to precisely discriminate devices and guarantee outstanding level of performance.

© 2015 IEEE

PDF Article
More Like This
Low-Frequency Noise Characteristics of InGaN-Based Light-Emitting Diodes

Chan-Hyoung Oh, Dong-Pyo Han, Dong-Soo Shin, and Jong-In Shim
26P_100 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2015

Influence of strong reverse-bias on the leakage behavior of light-emitting diodes

Y.N. Wang, C.Y. Tseng, Y. C. Chen, and N. C. Chen
WP_028 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2007

Study of the Ideality Factor of Blue Light-Emitting Diodes Using the Photovoltaic Characteristics

Jae-Hoon Ham, Chan-Hyoung Oh, Dong-Pyo Han, Hyunsung Kim, Jong-In Sim, Dong-Soo Shin, and Kyu-Sang Kim
26P_106 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2015

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved