THz-TDS based near-field imaging and spectroscopy at 25 nm length scale

F. Huth; D. Molter; J. Klier; J. Jonuscheit; G. von Freymann; F. Keilmann; A. J. Huber

2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference
(Optica Publishing Group, 2015),
paper CC_5_2

THz-TDS based near-field imaging and spectroscopy at 25 nm length scale

F. Huth, D. Molter, J. Klier, J. Jonuscheit, G. von Freymann, F. Keilmann, and A. J. Huber

The European Conference on Lasers and Electro-Optics 2015

Munich Germany
21–25 June 2015
ISBN: 978-1-4673-7475-0

From the session
THz Near-field Microscopy and Spectroscopy (CC_5)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
F. Huth, D. Molter, J. Klier, J. Jonuscheit, G. von Freymann, F. Keilmann, and A. J. Huber, "THz-TDS based near-field imaging and spectroscopy at 25 nm length scale," in 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference, (Optica Publishing Group, 2015), paper CC_5_2.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Save article

Abstract

We demonstrate THz near-field imaging and spectroscopy at length scales as small as ca. 25 nm based on integration of a standard THz-TDS system into a commercial scattering-type Scanning Near-field Optical Microscopy (s-SNOM) system.

PDF Article

More Like This

Infrared near-field spectroscopy with attogram sensitivity

Andreas J. Huber
JSII_P_4 European Quantum Electronics Conference (EQEC) 2017

THz Near-Field Nanoscopy at 25 Nanometer Spatial Resolution

Max Eisele, Andreas Huber, and Tobias Gokus
SW3D.2 CLEO: Science and Innovations (CLEO:S&I) 2018

Gap Plasmon Formation in Metallic, Nanofocusing SNOM Tapers for Broadband Nanospectroscopy

Simon F. Becker, Martin Esmann, KyungWan Yoo, Heiko Kollmann, Petra Groß, Ralf Vogelgesang, NamKyoo Park, and Christoph Lienau
EG_P_6 European Quantum Electronics Conference (EQEC) 2015

Previous Article Next Article