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Optica Publishing Group
  • 2015 European Conference on Lasers and Electro-Optics - European Quantum Electronics Conference
  • (Optica Publishing Group, 2015),
  • paper CH_P_29

Laser Absorption Trace Gas Monitor with a Tunable High Finesse External Cavity for Clinical Breath Analysis

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Abstract

Recently, it is increasing of importance to find out one's own diseases information based on breath analysis. In such clinical application, the analytical system should serve as a reliable and simple monitor detecting changes in trace gas constituents in their breath during a reasonably short time sequence [1]. Laser absorption spectrometer is one of excellent candidates to realize clinical breath analysis. In our facility, a compact, fiber coupled laser trace gas monitor using a passively locked external cavity (PLEC) has been demonstrated with a diode laser (DL) in visible red wavelength. In this paper, the monitor with PLEC to detect specific gases with only one coherent source continuously tunable at expanded wavelength range between 1.5µm and 1.7µm is proposed, and we experimentally investigated characteristic performance being able to detect trace components. The gas monitor employing a high finesse cavity with unique resonant mechanism could achieve a very long optical absorption path for highly sensitive absorption detection [2, 3]. When, a part of the returning beam from the external cavity into the anti-reflection diode laser (AR-DL), the intense optical feedback acts as passive injection seeding at a cavity resonance frequency. Since an AR-DL is a good, low-coherence, broadband amplifier, injection seeding is effective in driving the laser device in quasi-single mode operation. A 1.5µm AR-DL has broad gain spectra over ~250nm. In order to realize self-passive locking resulting in good intensity buildup at desired wavelength as obtained with DL, optical band pass filters (BPF) with ~1nm bandwidth are placed between an AR-DL and an external cavity as a limiting window of optical gain spectra of the 1.5µm AR-DL.

© 2015 IEEE

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