Abstract
Dielectric multilayer optics is the keystone within photonics and optoelectronics with numerous applications such as dielectric mirrors, filters, antireflection coatings and dispersion-engineered devices [1]. Research traditionally focuses on the layers thicknesses on the order of a quarter to a few wavelengths, leaving subwavelength layers (<λ/10) out as a somewhat unimportant subject. Moreover, contrary to metal-dielectric multilayer metamaterials with hyperbolic dispersion, homogenization of all-dielectric subwavelength multilayers has never been questioned. Nevertheless, very recent research points out [2] that in a certain regime close to the critical incidence angle even stacks made of layers as thin as λ/50 may exhibit a significant properties difference compared to the conventional Maxwell-Garnett homogenization.
© 2015 IEEE
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