Abstract

The difficulty in characterising nonlinear integrated structures lies in assessing the real power injected into the guided mode. Nonlinear characterisations of nano-waveguides currently reported in literature rarely give a precise determination of the coupling efficiency, while it directly affects the nonlinear response. Using a single beam top-hat Dispersive-Scan (D-Scan) method, a temporal analogue of the top-hat Z-Scan [1], we show the first nonlinear waveguide characterisation that simultaneously and accurately measures the input (𝜅_in) and output (𝜅_out) coupling efficiencies, the effective Two-Photon Absorption (γ_TPA ) and Kerr (γ) nonlinear parameters. Like in Z-Scan, the D-Scan technique [2] advantageously gives access to the sign of the Kerr coefficient.

© 2017 IEEE